Variational Algorithms to Remove Stationary Noise: Applications to Microscopy Imaging

被引:109
作者
Fehrenbach, Jerome [1 ,2 ]
Weiss, Pierre [1 ,2 ]
Lorenzo, Corinne [2 ]
机构
[1] Univ Toulouse, IMT Lab UMR5219, F-31042 Toulouse, France
[2] CNRS, ITAV Lab UMS3039, F-31106 Toulouse, France
关键词
Atomic force microscope; convex optimization; light sheet fluorescence microscope; nanotomography; non linear filtering; primal-dual scheme; scanning electron microscope; stationary noise; stripe removal; texture-geometry decomposition; total variation; DECOMPOSITION; MINIMIZATION;
D O I
10.1109/TIP.2012.2206037
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A framework and an algorithm are presented in order to remove stationary noise from images. This algorithm is called variational stationary noise remover. It can be interpreted both as a restoration method in a Bayesian framework and as a cartoon+texture decomposition method. In numerous denoising applications, the white noise assumption fails. For example, structured patterns such as stripes appear in the images. The model described here addresses these cases. Applications are presented with images acquired using different modalities: scanning electron microscope, FIB-nanotomography, and an emerging fluorescence microscopy technique called selective plane illumination microscopy.
引用
收藏
页码:4420 / 4430
页数:11
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