ATLAS irradiation studies of n-in-n and p-in-n silicon microstrip detectors

被引:11
作者
Allport, P
Andricek, L
Buttar, C
Carter, J
Drage, L
Ferrère, D [1 ]
Morgan, D
Riedler, P
Robinson, D
机构
[1] Univ Liverpool, Oliver Lodge Lab, Liverpool L69 3BX, Merseyside, England
[2] Max Planck Inst Phys, D-80805 Munich, Germany
[3] Univ Sheffield, Dept Phys, Sheffield S10 2TN, S Yorkshire, England
[4] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[5] Univ Geneva, DPNC, CH-1211 Geneva, Switzerland
[6] CERN, CH-1211 Geneva 23, Switzerland
关键词
ATLAS; silicon microstrip detectors; irradiation; annealing;
D O I
10.1016/S0168-9002(99)00413-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Prior to the module production of the ATLAS silicon microstrip tracker for the barrel and the forward wheels, the characterisation of full-size prototype silicon detectors after radiation to fluences corresponding to 10 years of ATLAS operation is required. The behaviour of p-in-n and n-in-n detectors produced by several manufacturers before and after irradiation to a fluence of 3 x 10(14) protons/cm(2) at the CERN PS facility is discussed. This article summarises some recent results from the ATLAS SCT collaboration. The measurements of leakage current, full depletion voltage, signal-to-noise ratio and charge collection efficiency are presented. Despite the better efficiency performance of n-in-n detectors below depletion, the collaboration chose the p-in-n technology due to its simpler and less costly production since good charge collection efficiencies were achieved at the desired maximum bias voltage. (C) 1999 Elsevier Science B.V. Ail rights reserved.
引用
收藏
页码:74 / 79
页数:6
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