A comparison of 3D interest point descriptors with application to airport baggage object detection in complex CT imagery

被引:85
作者
Flitton, Greg [1 ]
Breckon, Toby P. [1 ]
Megherbi, Najla [1 ]
机构
[1] Cranfield Univ, Sch Engn, Appl Math & Comp Grp, Cranfield MK43 0AL, Beds, England
关键词
CT baggage scan; Threat detection; Object recognition; 3D feature descriptors; CT object recognition; 3D SIFT; ARTIFACTS; SCALE; SIFT; REDUCTION; TRANSFORM; FEATURES; SHAPE;
D O I
10.1016/j.patcog.2013.02.008
中图分类号
TP18 [人工智能理论];
学科分类号
140502 [人工智能];
摘要
We present an experimental comparison of 3D feature descriptors with application to threat detection in Computed Tomography (CT) airport baggage imagery. The detectors range in complexity from a basic local density descriptor, through local region histograms and three-dimensional (3D) extensions to both to the RIFT descriptor and the seminal SIFT feature descriptor. We show that, in the complex CT imagery domain containing a high degree of noise and imaging artefacts, a specific instance object recognition system using simpler descriptors appears to outperform a more complex RIFT/SIFT solution. Recognition rates in excess of 95% are demonstrated with minimal false-positive rates for a set of exemplar 3D objects. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2420 / 2436
页数:17
相关论文
共 44 条
[1]
Improving weapon detection in single energy X-ray images through pseudocoloring [J].
Abidi, Besma R. ;
Zheng, Yue ;
Gribok, Andrei V. ;
Abidi, Mongi A. .
IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS, 2006, 36 (06) :784-796
[2]
Allaire Stephane, 2008, 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops), P1, DOI 10.1109/CVPRW.2008.4563023
[3]
[Anonymous], 2005, PROC CVPR IEEE
[4]
[Anonymous], 2008, IEEE NUCL SCI S C RE
[5]
[Anonymous], P 4 ALV VIS C
[6]
[Anonymous], 2009, ACM INT C PROCEEDING, DOI DOI 10.1145/1558607.1558630
[7]
[Anonymous], P BRIT MACH VIS C
[8]
LEAST-SQUARES FITTING OF 2 3-D POINT SETS [J].
ARUN, KS ;
HUANG, TS ;
BLOSTEIN, SD .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1987, 9 (05) :699-700
[9]
GENERALIZING THE HOUGH TRANSFORM TO DETECT ARBITRARY SHAPES [J].
BALLARD, DH .
PATTERN RECOGNITION, 1981, 13 (02) :111-122
[10]
Artifacts in CT: Recognition and avoidance [J].
Barrett, JF ;
Keat, N .
RADIOGRAPHICS, 2004, 24 (06) :1679-1691