MIC-SSMS analyses of eight new geological standard glasses

被引：13

作者：

Stoll, B ^{[1
]}

Jochum, KP ^{[1
]}

机构：

[1] Max Planck Inst Chem, D-55020 Mainz, Germany

来源：

FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 1999年 / 364卷 / 05期

关键词：

D O I：

10.1007/s002160051354

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

To obtain suitable geological reference materials for microanalytical purposes, a set of eight natural glasses was prepared by direct fusion of rock chips. Multi-ion counting spark source mass spectrometry (MIC-SSMS) has been applied for trace element analysis of these reference materials. The overall analytical uncertainty of the MIC-SSMS results was determined by considering 14 possible sources of errors. It generally ranges between < 2-7% depending on the element and its concentration. Nearly all MIC SSMS data agree with the reference values within 0-10%, indicating that the estimate of the overall analytical uncertainty is reasonable.

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页码：380 / 384

页数：5

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