Crack-like grain-boundary diffusion wedges in thin metal films

被引:190
作者
Gao, H [1 ]
Zhang, L
Nix, WD
Thompson, CV
Arzt, E
机构
[1] Stanford Univ, Dept Mech Engn, Div Mech & Computat, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
[3] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[4] Max Planck Inst Met Res, D-70174 Stuttgart, Germany
基金
美国国家科学基金会;
关键词
grain boundaries; thin films; surface diffusion; metals; defects theory & modeling;
D O I
10.1016/S1359-6454(99)00178-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Constrained grain-boundary diffusion in polycrystalline thin metal films on substrates is studied as a strongly coupled elasticity and grain-boundary diffusion problem in which no sliding and no diffusion are allowed at the film/substrate interface. Surface diffusion and grain-boundary grooving are neglected in the present analysis. We show that such a diffusion process leads to the formation of crack-like grain-boundary wedges which cause the normal traction along the grain boundary to decay exponentially with time. PL rigorous mathematical analysis is performed to derive and calculate the transient solutions for diffusion along a single grain boundary and along a periodic array of grain boundaries. An approximate closed-form solution is also given as a simple description of constrained grain-boundary diffusion. A most remarkable feature of the solution is that the diffusion wedges induce crack-like singular stress concentrations which could also enhance dislocation plasticity processes in a metal film. (C) 1999 Acta Metallurgica Inc. Published by Elsevier Science Ltd. AN rights reserved.
引用
收藏
页码:2865 / 2878
页数:14
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