Field ion microscopy of multiwall carbon nanotubes: observation of pentagons and cap breakage under high electric field

被引：21

作者：

Saito, Y ^{[1
]}

Mizushima, R ^{[1
]}

Hata, K ^{[1
]}

机构：

[1] Mie Univ, Dept Elect & Elect Engn, Tsu, Mie 5148507, Japan

来源：

SURFACE SCIENCE | 2002年 / 499卷 / 01期

关键词：

field ion microscopy; field evaporation; surface structure; morphology; roughness and topography; carbon;

D O I：

10.1016/S0039-6028(01)01913-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Field ion microscopy (FIM) study of multiwall carbon nanotubes (MWCNTs) was carried out, and carbon pentagons located at the tip of a capped MWCNT were observed with atomic resolution. Changes of structures of MWCNT tips, which were brought about by field evaporation of carbon during the FIM experiment, were also observed. A MWCNT emitter initially gave FIM images originating from extruded pentagons on its tip, but finally gave ring patterns. The final ring patterns were the same as those from open MWCNTs obtained by oxidation process. (C) 2002 Published by Elsevier Science B.V.

引用

页码：L119 / L123

页数：5

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