Auger resonant Raman scattering in itinerant electron systems:: Continuum excitation in Cu -: art. no. 027601

被引：16

作者：

Föhlisch, A ^{[1
]}

Karis, O ^{[1
]}

Weinelt, M ^{[1
]}

Hasselström, J ^{[1
]}

Nilsson, A ^{[1
]}

Mårtensson, N ^{[1
]}

机构：

[1] Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 88卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.88.027601

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The role of electron localization for resonant photoemission and Auger resonant Raman scattering to occur in an extended system was studied by polarization dependent resonant photoemission at the Cu L edges. Auger resonant Raman scattering was observed for continuum excitation into van Hove singularities at the L(1) and X(1) points, 4.2 and 7.7 eV above threshold. These findings show that resonant photoemission and Auger resonant Raman scattering are general features of photoemission independent of the degree of electron localization.

引用

页数：4

共 28 条

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