Scanning tip microwave near-field microscope

被引：172

作者：

Wei, T

Xiang, XD

WallaceFreedman, WG

Schultz, PG

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,INST MOLEC DESIGN,BERKELEY,CA 94720

[2] UNIV CALIF BERKELEY,DEPT CHEM,HOWARD HUGHES MED INST,BERKELEY,CA 94720

来源：

APPLIED PHYSICS LETTERS | 1996年 / 68卷 / 24期

关键词：

D O I：

10.1063/1.115773

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A near-field microscope which operates in the rf/microwave frequency range is described. In this microscope, a scanning tunneling microscope (STM)-like tip rather than an aperture is used as a point-like evanescent field emitter, A spatial resolution of similar to 5 mu m (similar to lambda/100 000) is achieved in, the current version. We design of the microscope as well as the principal factors which affect its performance are discussed. (C) 1996 American Institute of Physics.

引用

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页码：3506 / 3508

页数：3

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