High resolution X-ray scattering from nanotechnology materials

被引:3
作者
Tanner, BK [1 ]
Hase, TPA [1 ]
Clarke, J [1 ]
Pape, I [1 ]
Li-Bassi, A [1 ]
Fulthorpe, BD [1 ]
机构
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
基金
英国工程与自然科学研究理事会;
关键词
high resolution; X-ray scattering; silica film;
D O I
10.1016/S0169-4332(01)00424-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The application of X-ray scattering to the non-destructive determination of physical properties of nanostructured materials is illustrated through use of three example systems. High resolution parallel beam powder diffraction is used to measure particle size and melting temperature in Sn nanoparticles while full reciprocal space mapping allows the mosaic distribution of Co in epitaxial Ag films to be determined, The in-plane correlation length associated with steps on Ag surfaces and the period of artificial gratings are measured by grazing incidence scattering. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:202 / 208
页数:7
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