Application of simple mechanical polishing to fabrication of nanogap flat electrodes

被引:14
作者
Higuchi, Y
Ohgami, N
Akai-Kasaya, M
Saito, A
Aono, M
Kuwahara, Y
机构
[1] Osaka Univ, Fac Engn, Dept Mat & Life Sci, Suita, Osaka 5650871, Japan
[2] Japan Sci & Technol Agcy, JST, PRESTO, Kawaguchi, Saitama 3320012, Japan
[3] Japan Sci & Technol Agcy, JST, ICORP, Nanoscale Quantum Conductor Array Project, Kawaguchi, Saitama 3320012, Japan
[4] Inst Phys & Chem Res, RIKEN, Harima Inst, Sayo, Hyogo 6795148, Japan
[5] NIMS, Nanomat Lab, Tsukuba, Ibaraki 3050003, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2006年 / 45卷 / 4-7期
关键词
nanogap flat electrodes; electron beam lithography; mechanical polishing; conductance measurement;
D O I
10.1143/JJAP.45.L145
中图分类号
O59 [应用物理学];
学科分类号
摘要
We fabricated nanogap flat electrodes with smooth boundaries between metal electrodes and an insulating substrate for the purpose of evaluating the electrical transport properties of a single molecule and molecular assemblies. We proposed a simple fabricating procedure that combined a lift-off process containing electron beam lithography and reactive ion etching with a mechanical grinding process. The fabrication of flat electrodes with a 200 nm gap, whose step is less than similar to 1 nm, has been demonstrated using this procedure.
引用
收藏
页码:L145 / L147
页数:3
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