Observation of hot-electron shot noise in a metallic resistor

被引:219
作者
Steinbach, AH [1 ]
Martinis, JM [1 ]
Devoret, MH [1 ]
机构
[1] CEA SACLAY,SERV PHYS ETAT CONDENSE,F-91191 GIF SUR YVETTE,FRANCE
关键词
D O I
10.1103/PhysRevLett.76.3806
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have measured the current noise of silver thin-film resistors as a function of current and temperature and for resistor lengths of 7000, 100, 30, and 1 mu m. As the resistor becomes shorter than the electron-phonon interaction length, the current noise for large current increases from a nearly current independent value to the interacting hot-electron value (root 3/4)2eI. However, further reduction in length below the electron-electron interaction length decreases the noise to a value approaching the independent hot-electron value (1/3)2eI first predicted for mesoscopic resistors.
引用
收藏
页码:3806 / 3809
页数:4
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