Detection of defects using fault model oriented test sequences

This paper analyzes the possibilities and limitations of defect detection using fault model oriented test sequences. The analysis is conducted through the example of a short defect considering the static voltage test technique. Firstly, the problem of defect excitation and effect propagation is studied. It is shown that the effect can be either a defective effect or a defect-free effect depending on the value of unpredictable parameters. The concept of 'Analog Detectability Interval' (ADI) is used to represent the range of the unpredictable parameters creating a defective effect. It is demonstrated that the ADIs are pattern dependent. New concepts ('Global ADI', 'Covered ADI') are then proposed to optimize the defect detection taking into account the unpredictable parameters. Finally, the ability of a fault oriented test sequence to detect defect is discussed. In particular, it is shown that the test sequence generated to target the stuck-at faults can reasonably guarantee short defect detection till a limit given by the Analog Detectability Intervals.