Overview No. 133 - Atom probe microanalysis and nanoscale microstructures in metallic materials

被引：88

作者：

Hono, K ^{[1
]}

机构：

[1] Natl Res Inst Met, Tsukuba, Ibaraki 3050047, Japan

来源：

ACTA MATERIALIA | 1999年 / 47卷 / 11期

关键词：

atom probe; field ion microscopy; aluminum; amorphous materials; phase transformations;

D O I：

10.1016/S1359-6454(99)00175-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An atom probe field ion microscope (APFIM) is a unique microanalytical instrument with a single atom detection sensitivity. By employing a three-dimensional atom probe (3DAP), alloying elements can be mapped out in a three-dimensional space with near-atomic resolution. APFIM is particularly useful for the analysis of solute clusters and small precipitate particles, because it can collect atoms exclusively from nanoscale particles embedded in a matrix. These features are suitable for characterizing the complicated microstructures in commercial metallic materials. Recent atom probe investigations on the nanoscale microstructures of the metallic materials are overviewed to demonstrate the unique feature of the APFIM technique. (C) 1999 Acta Metallurgica Inc. Published by Elsevier Science Ltd. All rights reserved.

引用

页码：3127 / 3145

页数：19

共 95 条

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