Surface segregation in yttria-stabilized zirconia by means of angle resolved X-ray photoelectron spectroscopy

Surface segregation of cations in undoped and titanium-doped yttria-stabilized zirconia was studied in air in the temperature range from 800 to 1400 degreesC. Surface composition and distribution of the elements across the surface layer was examined using angle resolved X-ray photoelectron spectroscopy. The annealing procedure induced a silicon-rich surface layer of low zirconium concentration. The yttrium concentration only slightly increased at the surface. Enrichment factor of titanium in the titanium-doped yttria-stabilized zirconia was found to be higher than that of yttrium. No significant correlation between segregation of other cations was found. (C) 2001 Elsevier Science Ltd. All rights reserved.