Stress dependence of exciton relaxation processes in Cu2O -: art. no. 085211

被引：41

作者：

Denev, S ^{[1
]}

Snoke, DW ^{[1
]}

机构：

[1] Univ Pittsburgh, Dept Phys & Astron, Pittsburgh, PA 15260 USA

来源：

PHYSICAL REVIEW B | 2002年 / 65卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.65.085211

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A comprehensive study of the exciton relaxation processes in Cu2O has led to some surprises. We find that the ortho-para conversion rate becomes slower at high stress and that the Auger nonradiative recombination rate increases with stress, with apparently no Auger recombination at zero stress. These results have important consequences for the pursuit of Bose-Einstein condensation of excitons in a harmonic potential.

引用

页码：1 / 8

页数：8

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