Transverse Kerr magnetometry for the study of thin films presenting perpendicular and in-plane anisotropy

A model for the behaviour of transverse initial susceptibility as a function of de applied field is developed for the case of thin films exhibiting simultaneous in-plane and perpendicular anisotropy. It is used to deduce in-plane and perpendicular anisotropy fields in a very simple way from transverse susceptibility measurements made by the transverse Ken: effect, The results obtained are cross-checked by those obtained from magnetization curves.