Carbon 1s X-ray photoemission line shape analysis of highly oriented pyrolytic graphite: The influence of structural damage on peak asymmetry

被引:150
作者
Yang, DQ [1 ]
Sacher, E [1 ]
机构
[1] Ecole Polytech, Dept Genie Phys, Regroupement Quebecois Mat Pointe, Montreal, PQ H3C 3A7, Canada
关键词
D O I
10.1021/la052922r
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
C 1s XPS spectra of various highly oriented pyrolytic graphite (HOPG) surfaces, untreated, as well as those treated by keV Ar+ beam bombardment and low-energy O-2, N-2, Ar, and H2O plasmas, have been systematically studied by comparing two XPS peak-fitting procedures. These procedures treat the spectrum as either (1) the overlap of several symmetric component peaks or (2) a single asymmetric peak. The results indicate that, in the case of HOPG, the asymmetry parameter defining the single peak is directly related to the extent of damage to the alternant hydrocarbon structure of the HOPG surface, as manifested by its correlation with the symmetric peak component due to the damaged HOPG structure.
引用
收藏
页码:860 / 862
页数:3
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