New design for quantum dots cellular automata to obtain fault tolerant logic gates

In this paper, we analyze fault tolerance properties of the Majority Gate, as the main logic gate for implementation with Quantum dots Cellular Automata (QCA), in terms of fabrication defect. Our results demonstrate the poor fault tolerance properties of the conventional design of Majority Gate and thus the difficulty in its practical application. We propose a new approach to the design of QCA-based Majority Gate by considering two-dimensional arrays of QCA cells rather than a single cell for the design of such a gate. We analyze fault tolerance properties of such Block Majority Gates in terms of inputs misalignment and irregularity and defect (missing cells) in assembly of the array. We present simulation results based on semiconductor implementation of QCA with an intermediate dimensional dot of about 5 nm in size as opposed to magnetic dots of greater than 100 nm or molecular dots of 2-5Angstrom. Our results clearly demonstrate the superior fault tolerance properties of the Block Majority Gate and its greater potential for a practical realization. We also show the possibility of designing fault tolerant QCA circuits by using Block Majority Gates.