Electron microscopy study on structure of rolled-up semiconductor nanotubes

被引:29
作者
Jin-Phillipp, NY
Thomas, J
Kelsch, M
Deneke, C
Songmuang, R
Schmidt, OG
机构
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[2] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
关键词
Nanotubes;
D O I
10.1063/1.2164913
中图分类号
O59 [应用物理学];
学科分类号
摘要
By releasing strained epitaxial layers from their substrates, the layers roll up to form nanotubes. The structures of InAs/GaAs and SiGe/Si rolled-up nanotubes (RUNTs) are characterized by using transmission electron microscopy (TEM), electron diffraction, high-resolution TEM, and spatially resolved electron energy-loss spectroscopy. Freestanding RUNTs as well as their cross sections are investigated. It is found that the walls of the nanotubes are composed of alternating crystalline and noncrystalline oxide-containing layers. Defects may form in some nanotubes, where the rolling involves a misorientation. (c) 2006 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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