Enhanced sensitivity to oxide surface defects using Auger-photoelectron coincidence spectroscopy

被引:10
作者
See, AK
Siu, WK
Bartynski, RA
Nangia, A
Weiss, AH
Hulbert, SL
Wu, X
Kao, CC
机构
[1] RUTGERS STATE UNIV,DEPT PHYS,PISCATAWAY,NJ 08855
[2] RUTGERS STATE UNIV,SURFACE MODIFICAT LAB,PISCATAWAY,NJ 08855
[3] UNIV TEXAS,DEPT PHYS,ARLINGTON,TX 76019
[4] UNIV TEXAS,MAT SCI PROGRAM,ARLINGTON,TX 76019
[5] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE DEPT,UPTON,NY 11973
基金
美国国家科学基金会;
关键词
Auger ejection; Auger electron spectroscopy; photoelectron emission; surface defects; titanium oxide;
D O I
10.1016/S0039-6028(97)00165-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present Auger-photoelectron coincidence (APECS) spectra of the Ti 3p core level obtained in coincidence with Ti M2,3VV Auger electrons from the stoichiometric and Vacuum annealed TiO2(110) surfaces. For both surfaces, emission corresponding to reduced oxidation states has approximately an order of magnitude greater relative intensity in the coincidence spectrum as compared with the corresponding ordinary (singles) photoemission spectrum. We associate the excess coincidence signal from the stoichiometric surface with previously undetected residual defects. The origins and implications of the enhanced sensitivity of APECS to defects at oxide surfaces is discussed. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:L735 / L741
页数:7
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