KWS-3, the new focusing-mirror ultra small-angle neutron scattering instrument and reflectometer at Julich

被引:21
作者
Kentzinger, E. [1 ]
Dohmen, L. [1 ]
Alefeld, B. [1 ]
Ruecker, U. [1 ]
Stellbrink, J. [1 ]
Ioffe, A. [1 ]
Richter, D. [1 ]
Brueckel, Th. [1 ]
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
关键词
Focusing mirror; Small-angle neutron scattering; Reflectometry;
D O I
10.1016/j.physb.2004.03.203
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
In Julich, a new high-resolution small-angle neutron scattering (SANS) instrument and reflectometer has been built. The principle of this instrument is a one-to-one image of an entrance aperture on a 2D position-sensitive detector by neutron reflection on a double-focusing toroidal mirror. It permits to perform SANS studies with a scattering wave vector resolution between 10(-3) and 10(-4) angstrom(-1) with considerable intensity advantages over pinhole-SANS instruments. To date, KWS-3 is the worldwide unique SANS instrument running on this principle. We present here the characterization of the image produced by the mirror and a measurement of the scattering from a diffraction grating. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:E779 / E781
页数:3
相关论文
共 6 条
[1]   X-ray space technology for focusing small-angle neutron scattering and neutron reflectometry [J].
Alefeld, B ;
Dohmen, L ;
Richter, D ;
Brückel, T .
PHYSICA B, 2000, 283 (04) :330-332
[2]   NEW DEVELOPMENTS OF SMALL-ANGLE NEUTRON-SCATTERING INSTRUMENTS WITH FOCUSING [J].
ALEFELD, B ;
SCHWAHN, D ;
SPRINGER, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 274 (1-2) :210-216
[3]   Space technology from X-ray telescopes for focusing SANS and reflectometry [J].
Alefeld, B ;
Dohmen, L ;
Richter, D ;
Brückel, T .
PHYSICA B-CONDENSED MATTER, 2000, 276 (276) :52-54
[4]   X-RAY TELESCOPES [J].
ASCHENBACH, B .
REPORTS ON PROGRESS IN PHYSICS, 1985, 48 (05) :579-629
[5]   Towards a 3D magnetometry by neutron reflectometry [J].
Fermon, C ;
Ott, F ;
Gilles, B ;
Marty, A ;
Menelle, A ;
Samson, Y ;
Legoff, G ;
Francinet, G .
PHYSICA B-CONDENSED MATTER, 1999, 267 :162-167
[6]   LOW ANGLE X-RAY DIFFRACTION WITH LONG WAVELENGTHS [J].
HENKE, B ;
DUMOND, JWM .
PHYSICAL REVIEW, 1953, 89 (06) :1300-1300