A numerical approach to copolymers at selective interfaces

被引:16
作者
Caravenna, F
Giacomin, G
Gubinelli, M
机构
[1] Univ Milano Bicocca, Dipartimento Matemat & Applicaz, I-20125 Milan, Italy
[2] Univ Paris 06, Probabil Lab, CNRS, UMR 7599, F-75251 Paris 05, France
[3] Univ Paris 07, Probabil Lab, CNRS, UMR 7599, F-75251 Paris 05, France
[4] Univ Paris 07, UFR Math, F-75251 Paris 05, France
[5] Univ Pisa, Dipartimento Matemat Applicata U Dini, I-56126 Pisa, Italy
关键词
disordered models; copolymers; localization transition; large deviations; corrections to Laplace estimates; concentration of measure; transfer matrix approach; statistical tests;
D O I
10.1007/s10955-005-8081-z
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We consider a model of a random copolymer at a selective interface which undergoes a localization/delocalization transition. In spite of the several rigorous results available for this model, the theoretical characterization of the phase transition has remained elusive and there is still no agreement about several important issues, for example the behavior of the polymer near the phase transition line. From a rigorous viewpoint non coinciding upper and lower bounds on the critical line are known. In this paper we combine numerical computations with rigorous arguments to get to a better understanding of the phase diagram. Our main results include: Various numerical observations that suggest that the critical line lies strictly in between the two bounds. A rigorous statistical test based on concentration inequalities and super-additivity, for determining whether a given point of the phase diagram is in the localized phase. This is applied in particular to show that, with a very low level of error, the lower bound does not coincide with the critical line. An analysis of the precise asymptotic behavior of the partition function in the delocalized phase, with particular attention to the effect of rare at typical stretches in the disorder sequence and on whether or not in the delocalized regime the polymer path has a Brownian scaling. A new proof of the lower bound on the critical line. This proof relies on a characterization of the localized regime which is more appealing for interpreting the numerical data.
引用
收藏
页码:799 / 832
页数:34
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