Design of a self-correcting Active Pixel Sensor

被引:16
作者
Audet, Y [1 ]
Chapman, GH [1 ]
机构
[1] Ecole Polytech, Dept Elect & Comp Engn, Montreal, PQ H3C 3A7, Canada
来源
2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2001年
关键词
D O I
10.1109/DFTVS.2001.966748
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Digital cameras are growing ever larger in silicon area and pixel count, which increases the occurance of defects at fabrication time, or dead pixels that develop over their lifetime. An Active Pixel Sensors self-correcting for most common faults is created by spliting the photodiode and readout transistors into two parallel portions with only a small area cost. Simulations show operation is the same a single large device when no faults. When one half of the redundant pixel is stuck at low. output over, a wide current range is reduced by 1.98 to 2.01. For one half stuck at high faults output, after offset removal. is reduced by a factor of 1.85 to 1.92. Hence self-correction of the pixel can be done with good accuracy via a simple shift circuit and with high accuracy with digital processing. Variation in transistor threshold voltages between the pixel halves of even 10% only causes modification of factors by 2-4%, hence giving a small effect.
引用
收藏
页码:18 / 26
页数:9
相关论文
共 3 条
[1]  
Chapleo CB, 1999, CHEM BRIT, V35, P22
[2]  
FOSSUM ER, 1993, P SOC PHOTO-OPT INS, V1900, P2, DOI 10.1117/12.148585
[3]  
KOREN I, 2000, P INT S DEF FAULT TO