Characterization of Sphaeropsis sapinea from the west central United States by means of random amplified polymorphic DNA marker analysis

被引：29

作者：

Stanosz, GR

Smith, DR

Guthmiller, MA

机构：

[1] Department of Plant Pathology, University of Wisconsin-Madison

[2] Department of Plant Pathology, University of Wisconsin-Madison, Madison, WI 53706

来源：

PLANT DISEASE | 1996年 / 80卷 / 10期

关键词：

Diplodia pinea;

D O I：

10.1094/PD-80-1175

中图分类号：

Q94 [植物学];

学科分类号：

071001 ;

摘要：

Two morphotypes (A and B) of the conifer pathogen Sphaeropsis sapinea recently have been confirmed as distinct populations by analyses of random amplified polymorphic DNA (RAPD) markers. Because much of the research on Sphaeropsis shoot blight and canker has been conducted in the west central United States, a study was undertaken to determine the morphotype(s) of S. sapinea encountered in this region. RAPD markers were obtained for 42 isolates of S. sapinea collected in Iowa, Nebraska, Oklahoma, and South Dakota from Picea pungens, Pinus contorta, P. nigra, P. ponderosa, P. resinosa, P. sylvestris, and Pseudotsuga menziesii. Relationships among these isolates, and eight other previously characterized isolates, were determined by cluster analysis. All 42 west central region isolates were placed in a single group with the previously characterized A morphotype isolates. This result facilitates interpretation of past research in that region and extrapolation to other areas where the A morphotype of S. sapinea is present.

引用

页码：1175 / 1178

页数：4

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