Accurate method for determining the refractive-index profiles of planar waveguides in uniaxial media with the optical axis normal to the surface

被引：10

作者：

Offersgaard, JF ^{[1
]}

Veng, T ^{[1
]}

Skettrup, T ^{[1
]}

机构：

[1] TECH UNIV DENMARK,DEPT PHYS,DK-2800 LYNGBY,DENMARK

来源：

APPLIED OPTICS | 1996年 / 35卷 / 15期

关键词：

planar waveguides; anisotropy; gradient index;

D O I：

10.1364/AO.35.002602

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new method for characterization of uniaxial planar waveguides from their measured effective mode indices is presented. The theory is outlined and expressions for efficient computer analysis are given. Uniaxial waveguide samples have been made in c-cut LiNbO3 by proton exchange with and without post annealing in order to test the method on both steplike and graded-index profiles. The resulting characterization of the samples is discussed in relation to the inverse WKB method. Finally, the importance of incorporating the effects of material birefringence in the characterization of these kinds of waveguides is investigated. (C) 1996 Optical Society of America

引用

页码：2602 / 2609

页数：8

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