Stability and quality factor of a one-dimensional subwavelength cavity resonator containing a left-handed material

被引：26

作者：

Shen, LF ^{[1
]}

He, SL

Xiao, SS

机构：

[1] Zhejiang Univ, Ctr Opt & Electromagnet Res, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Peoples R China

[2] Royal Inst Technol, Div Electromagnet Theory, Alfven Lab, S-10044 Stockholm, Sweden

来源：

PHYSICAL REVIEW B | 2004年 / 69卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.69.115111

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The characteristics of a one-dimensional subwavelength cavity resonator (SWCR) formed by a left-handed material layer and a right-handed material layer are studied. Some previously published conclusions for some fundamental issues are discussed and rectified. Our analysis for the stability and the quality factor of the SWCR shows that the two materials should be mismatched in the impedance in order to obtain a useful SWCR. It is shown that the resonant frequency of the cavity is closely related to the total thickness of the cavity. The total thickness can still be far less than the resonant wavelength if the thickness ratio of the two layers is chosen appropriately. The compactness of the SWCR is restricted by its stability and quality factor.

引用

页数：6

共 8 条

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