Laboratory measurement of sampled infrared imaging system performance

被引:36
作者
Driggers, RG [1 ]
Webb, C
Pruchnic, SJ
Halford, CE
Burroughs, EE
机构
[1] USA, Commun & Elect Command, Night Vis & Elect Sensors Directorate, AMSEL RD NV SSAD, Ft Belvoir, VA 22060 USA
[2] Memphis State Univ, Dept Elect Engn, Memphis, TN 38152 USA
[3] E OIR Measurements Inc, Spotsylvania, VA 22553 USA
[4] USA, Test & Evaluat Command, Redstone Tech Test Ctr, Redstone Arsenal, AL 35898 USA
关键词
sampling; imaging system performance; noise equivalent temperature difference; modulation transfer functions; minimum resolvable temperature difference; infrared systems; performance; measurements;
D O I
10.1117/1.602249
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper is a tutorial on the laboratory measurement of sampled infrared imager performance. A review of the classical infrared imager performance measurements that describe sensitivity, resolution, and human interpretation performance is presented. These parameters are Noise Equivalent Temperature Difference (NETD), Modulation Transfer Function (MTF), and Minimum Resolvable Temperature Difference (MRTD or just MRT), respectively. The sensitivity parameters are extended to undersampled imaging systems with 3-D Noise, Inhomogeneity Equivalent Temperature Difference (IETD), and correctability. Also, the measurement of the detector MTF of sampled systems is described using either a scanning slit or tilted edge. Finally, the MRT of sampled systems is a strong function of target to sensor phase. A solution to the phase dependence and sampling limitations is the dynamic MRT, or DMRT. All of these tests are presented in detail and the problems associated with the laboratory measurement of sampled imaging systems are described.
引用
收藏
页码:852 / 861
页数:10
相关论文
共 24 条
[1]  
BELL PA, 1993, P SOC PHOTO-OPT INS, V1969, P194, DOI 10.1117/12.154715
[2]   Triangle orientation discrimination: the alternative to minimum resolvable temperature difference and minimum resolvable contrast [J].
Bijl, P ;
Valeton, JM .
OPTICAL ENGINEERING, 1998, 37 (07) :1976-1983
[3]  
Boreman G.D., 1995, HDB OPTICS
[4]  
BURROUGHS E, 1996, P SOC PHOTO-OPT INS, V3063, P214
[5]  
DAGOSTINO J, 1991, P SOC PHOTO-OPT INS, V1488, P110, DOI 10.1117/12.45794
[6]  
DRIGGERS R, 1990, OPT ENG, V27, P781
[7]   EQUIVALENT TEMPERATURE DIFFERENCES WITH RESPECT TO AMBIENT-TEMPERATURE DIFFERENCE AS A FUNCTION OF BACKGROUND TEMPERATURE [J].
DRIGGERS, RG ;
BOYLSTON, GL ;
EDWARDS, GT .
OPTICAL ENGINEERING, 1992, 31 (06) :1357-1361
[8]  
Gaskill J., 1978, LINEAR SYSTEMS FOURI, P343
[9]  
Holst G., 1993, INFRARED ELECTROOPTI, P235
[10]  
HOOVER CW, 1991, P SOC PHOTO-OPT INS, V1488, P280