Near-field phase measurement by Fourier analysis of the fringe pattern

被引：3

作者：

Charraut, D ^{[1
]}

Bainier, C ^{[1
]}

Courjon, D ^{[1
]}

Girard, C ^{[1
]}

机构：

[1] UNIV FRANCHE COMTE,UFR SCI,CNRS UMR 6624,PHYS MOL LAB,F-25030 BESANCON,FRANCE

来源：

PURE AND APPLIED OPTICS | 1997年 / 6卷 / 05期

关键词：

D O I：

10.1088/0963-9659/6/5/002

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

As for any electromagnetic field the optical near field in the vicinity of an object is fully described by its amplitude and its phase. However, despite the interest in extracting the information contained in the phase variations, until now mainly the intensity has been investigated. In this paper it will be shown that the phase information can be extracted and measured from the detected intensity, by using in the near-field regime techniques developed in conventional far-field interferometry. It will be shown from experimental and theoretical data that the near-field phase can carry information different from the amplitude.

引用

页码：491 / 502

页数：12

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