Electrostatically actuated dip pen nanolithography probe arrays

被引:33
作者
Bullen, D [1 ]
Liu, C [1 ]
机构
[1] Univ Illinois, Micro Actuators Sensors & Syst Grp, Micro & Nanotechnol Lab, Urbana, IL 61801 USA
基金
美国国家科学基金会;
关键词
dip pen nanolithography (DPN); electrostatic actuator; atomic force microscope; nanolithography;
D O I
10.1016/j.sna.2005.09.001
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Dip pen nanolithography (DPN) is a method of creating nanoscale chemical patterns on surfaces using an atomic force microscope (AFM) probe. Until now, efforts to increase the process throughput have focused on passive multi-probe arrays and active arrays based on thermal bimetallic actuation. This paper describes the first use of electrostatic actuation to create an active DPN probe array. Electrostatic actuation offers the benefit of actuation without the probe heating required for thermal bimetallic actuation. Actuator cross talk between neighboring probes is also reduced, permitting more densely spaced probe arrays. The array presented here consists of 10 cantilever probes, where each is 120 mu m long and 20 mu m wide. Each cantilever probe is actuated by the electrostatic force between the probe and a built-in counter electrode with a 20-25 mu m gap. The tip-to-tip probe spacing, also called the array pitch, is 30 mu m. Patterns of l-octadecanethiol were created on gold surfaces to demonstrate single-probe actuation, simultaneous multi-probe actuation, and overlap of patterns from adjacent probes. The rninirnurn line width was 25 nm with an average line width of 30-40nm. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:504 / 511
页数:8
相关论文
共 19 条
[1]   MICROLEVER WITH COMBINED INTEGRATED SENSOR ACTUATOR FUNCTIONS FOR SCANNING FORCE MICROSCOPY [J].
BRUGGER, J ;
BLANC, N ;
RENAUD, P ;
DEROOIJ, NF .
SENSORS AND ACTUATORS A-PHYSICAL, 1994, 43 (1-3) :339-345
[2]   Design, fabrication, and characterization of thermally actuated probe Arrays for dip pen nanolithography [J].
Bullen, D ;
Wang, XF ;
Zou, J ;
Chung, SW ;
Mirkin, CA ;
Liu, C .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2004, 13 (04) :594-602
[3]   Parallel dip-pen nanolithography with arrays of individually addressable cantilevers [J].
Bullen, D ;
Chung, SW ;
Wang, XF ;
Zou, J ;
Mirkin, CA ;
Liu, C .
APPLIED PHYSICS LETTERS, 2004, 84 (05) :789-791
[4]  
BULLEN D, 2003, RAP PROT TECHN BOST
[5]   Integration of through-wafer interconnects with a two-dimensional cantilever array [J].
Chow, EM ;
Soh, HT ;
Lee, HC ;
Adams, JD ;
Minne, SC ;
Yaralioglu, G ;
Atalar, A ;
Quate, CF ;
Kenny, TW .
SENSORS AND ACTUATORS A-PHYSICAL, 2000, 83 (1-3) :118-123
[6]  
Demers LM, 2001, ANGEW CHEM INT EDIT, V40, P3069, DOI 10.1002/1521-3773(20010817)40:16<3069::AID-ANIE3069>3.0.CO
[7]  
2-J
[8]   The evolution of dip-pen nanolithography [J].
Ginger, DS ;
Zhang, H ;
Mirkin, CA .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2004, 43 (01) :30-45
[9]   Multiple ink nanolithography: Toward a multiple-pen nano-plotter [J].
Hong, SH ;
Zhu, J ;
Mirkin, CA .
SCIENCE, 1999, 286 (5439) :523-525
[10]  
KING WP, 2000, SOL STAT SENS ACT WO