Multiple time scales in diffraction measurements of diffusive surface relaxation

被引：24

作者：

Fleet, A ^{[1
]}

Dale, D

Woll, AR

Suzuki, Y

Brock, JD

机构：

[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

[2] Cornell Univ, Cornell Ctr Mat Res, Ithaca, NY 14853 USA

[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA

[4] Cornell Univ, Cornell High Energy Synchrotron Source, Ithaca, NY 14853 USA

[5] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 05期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1103/PhysRevLett.96.055508

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We grew SrTiO3 on SrTiO3(001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small-angle scattering exhibits a well-defined length scale associated with the spacing between unit-cell high surface features. This length scale imposes a discrete spectrum of Fourier components and rate constants upon the diffusion equation solution, evident in multiple exponential relaxation of the "anti-Bragg" diffracted intensity. An Arrhenius analysis of measured rate constants confirms that they originate from a single activation energy.

引用

页数：4

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