A focusing multilayer analyser for local diffraction studies

A novel X-ray diffraction technique for the local structural characterization of thick specimens is presented. Broad energy-band focusing elements are used both on the incoming and exit (diffracted) side of the sample. The geometry allows imaging, and magnification, of a line through the thickness of the sample. In comparison with conventional methods of defining three-dimensional gauge volumes the new technique provides superior depth resolution, higher flux, and a remedy for some systematic errors occurring in strain measurements due to, for example, grain size effects. The technique is validated by a synchrotron test experiment using a bent and meridionally graded multilayer as the focusing analyser element. The incoming beam is monochromated, at 30 keV, and focused to a 15 mu m spot size by means of a bent Laue crystal. The resulting depth profile from the (222) reflection of a 21 mu m-thick rolled Au foil has a width of 44 mu m. The depth resolution, magnification and reflectivity as a function of the energy bandwidth are found to be well matched by theory. The prospect of the technique and the associated aberrations are discussed.