Method of direct determination of relaxation time distribution function in glasses, relaxor and ferroelectric phases

被引:2
作者
Leshchenko, MA
Bovtun, VP
机构
[1] Microelectronics Department, Kiev Polytechnic Institute, Kiev, 252056, 37, Pobedi Ave.
关键词
D O I
10.1080/00150199708014117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Experimental dielectric spectra epsilon*(omega) of many real materials (ceramics, for instance) usually differs from the curve ordered by Debye's law. This phenomenon is an intrinsic feature of that materials and is a consequence of relaxators (relaxing participles) distribution vs frequency or of relaxators interactions. We have suggested and developed new method of direct determination of relaxation times distribution function (RTDF) Y(Omega) from experimental data epsilon*(omega). So, experimental errors Delta epsilon in real dielectric spectra epsilon*(omega) were the main problem for previous approaches to the issue of RTDF determination. We solved this problem by using Tikhonov's regularization approach to build correct method of Y(Omega,T) determination from real experimental data epsilon*(omega) + Delta epsilon. Suggested method was tested on model dielectric spectra. Using this method we have obtained interesting results in the investigation of K1-XLiXTaO3-single crystals. Some of these results are present in this paper.
引用
收藏
页码:203 / 208
页数:6
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