Oxidation of Si(100)2x1: thermodynamics of oxygen insertion and migration

被引:48
作者
Stefanov, BB [1 ]
Raghavachari, K [1 ]
机构
[1] AT&T BELL LABS, LUCENT TECHNOL, MURRAY HILL, NJ 07974 USA
关键词
density functional calculations; oxidation; silicon; surface chemical reaction;
D O I
10.1016/S0039-6028(97)00613-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Accurate quantum chemical calculations on model cluster molecules are used to identify and compare the most probable surface structures involved in the oxidation of the Si(100)2 x 1 surface. The energetics of various reaction channels for insertion of oxygen into Si-Si bonds are evaluated. The dimer bond is clearly shown to be the initial target of O entry and an oxygen-inserted dimer is proposed as the most likely structure at lower temperatures. At higher temperatures an asymmetrically oxidized dimer unit with three oxygen atoms inserted into Si-Si bonds at the same silicon is the dominant feature. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:L1159 / L1164
页数:6
相关论文
共 15 条