Study of thin-film media for linear densities beyond 500 KBPI

被引：5

作者：

Shi, S ^{[1
]}

Liu, F

Tong, HC

Dey, S

Kimmal, J

Malhotra, S

Lal, BB

Schultz, M

机构：

[1] Read Rite Cooperat, Milpitas, CA 95035 USA

[2] HMT Technol, Fremont, CA USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1999年 / 35卷 / 05期

关键词：

bit-cell ratio; spin-valve head; track edge noise; thin-film medium;

D O I：

10.1109/20.800922

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The linear density capability of thin-film media with a coercivity of about 2900 Oe and M(r)t ranging from 0.33 to 0.5 memu/cm(2) was studied with tie advanced dual-spin valve heads used for the 14 Gbits/in(2) areal density demonstration. With an on track error rate of 10(-7) as the criterion, a linear density as high as 546 KFCI was achieved with the optimum head/medium design. Track edge noise was studied. Its effect on linear density design was examined. These results were used for designing the 14 Gbits/in(2) system.

引用

页码：2634 / 2636

页数：3

共 6 条

[1] Bit cell aspect ratio: An SNR and detection perspective [J].