X-ray-absorption edge separation using diffraction anomalous fine structure

被引:15
作者
Ravel, B [1 ]
Bouldin, CE
Renevier, H
Hodeau, JL
Berar, JF
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] CNRS, Cristallog Lab, F-38042 Grenoble 09, France
来源
PHYSICAL REVIEW B | 1999年 / 60卷 / 02期
关键词
D O I
10.1103/PhysRevB.60.778
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
When two or more absorption edges in a material are sufficiently close in energy, extended-x-ray-absorption-fine-structure spectroscopy is of limited utility as the usable data range above the lower-energy edge is truncated by the higher-energy edge. Energy or wavelength discriminating detection methods may fail to resolve fluorescence lines which are very close in energy. In this paper we present a solution to this problem using the resolution in momentum transfer of diffraction anomalous fine structure (DAFS) to separate the fine-structure signals from elements with closely spaced fluorescence lines. We demonstrate our technique by isolating the titanium edge signal from DAFS measurements of BaTiO3.
引用
收藏
页码:778 / 785
页数:8
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