A unique polarized x-ray facility at the Advanced Photon Source

被引：73

作者：

Freeland, JW ^{[1
]}

Lang, JC ^{[1
]}

Srajer, G ^{[1
]}

Winarski, R ^{[1
]}

Shu, D ^{[1
]}

Mills, DM ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2002年 / 73卷 / 03期

关键词：

D O I：

10.1063/1.1435814

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

To use the unique element-specific nature of polarized x-ray techniques to study a wide variety of problems related to magnetic materials, we have developed a dual-branch sector that simultaneously provides both hard and soft x-ray capabilities. This facility, which is located in sector 4, is equipped with two different insertion devices providing photons in both the intermediate (0.5-3 keV) and hard x-ray regions (3-100 keV). This facility is designed to allow the simultaneous branching of two undulator beams generated in the same straight section of the ring. (C) 2002 American Institute of Physics.

引用

页码：1408 / 1410

页数：3

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