HIGH RESOLUTION X-RAY DIFFRACTION METHODS FOR THE STRUCTURAL CHARACTERISATION OF CRYSTALLINE MATERIALS

A new high-resolution X-ray diffractometer is described which combines and enhances the flexibility of a 4-circle diffractometer with the possibility to use it as a bond camera and as grazing incidence surface diffractometer. The X-ray beam is strictly monochromatic (CuK alpha(1)) and focused with a long focal length on the sample. The beam diameter is adjustable between 0.05 mm and 5 mm. The sample goniometer can be rotated around three perpendicular axes with two rotation axes perpendicular to the direction of the incoming beam. The instruments are equipped with 1D and 2D detectors, their distance to the sample can be varied between 10 and 30 cm. The detectors themselves have additional degrees of freedom so that out-of-plane reflections can be measured. In our contribution we describe mainly the experimental methods connected with this special equipment which allows the characterisation of a wide variety of specimens (single crystals, thin films, and ceramic or powder materials).