Experimental confirmation of chaos in a current-programmed Cuk converter

被引：23

作者：

Tse, CK

Fung, SC

Kwan, HW

机构：

[1] Department of Electronic Engineering, Hong Kong Polvlechnic University

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS | 1996年 / 43卷 / 07期

关键词：

D O I：

10.1109/81.508184

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter presents experimental evidence for the chaotic behavior in a fourth-order Cuk converter under current-programmed control which has been studied and simulated in [1].

引用

页码：605 / 608

页数：4