Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors

被引：46

作者：

Genest, J ^{[1
]}

Tremblay, P ^{[1
]}

机构：

[1] Univ Laval, Dept Genie Elect & Genie Informat, Ctr Opt Photon & Laser, Quebec City, PQ G1K 7P4, Canada

来源：

APPLIED OPTICS | 1999年 / 38卷 / 25期

关键词：

D O I：

10.1364/AO.38.005438

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple and powerful method for obtaining analytic instrument line shapes (ILS's) for Fourier transform spectrometers is explained. ILS's for off-axis circular and rectangular detectors are calculated to illustrate the method. Results match earlier ILS simulations. The contribution of the nonuniformity of light intensity across the detector surface is also taken into account. (C) 1999 Optical Society of America.

引用

页码：5438 / 5446

页数：9

共 9 条

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