共 311 条
[113]
Hiraoka K, 1998, RAPID COMMUN MASS SP, V12, P1170, DOI 10.1002/(SICI)1097-0231(19980915)12:17<1170::AID-RCM297>3.0.CO
[114]
2-O
[115]
HIYAGON H, 1997, ANTARCT METEORITE RE, V10, P249
[117]
Determination and application of the depth resolution function in sputter profiling with secondary ion mass spectroscopy and Auger electron spectroscopy
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
1998, 16 (03)
:1096-1102
[118]
Hoppstock K, 1997, ATOM SPECTROSC, V18, P180
[119]
Horita T, 1998, J AM CERAM SOC, V81, P315, DOI 10.1111/j.1151-2916.1998.tb02336.x
[120]
Hoskin PWO, 1998, J TRACE MICROPROBE T, V16, P301