Spectroscopic and structural characterisation of a VOx (x ≈ 1) ultrathin epitaxial film on Pt (111)

被引：7

作者：

Petukhov, M

Rizzi, GA

Granozzi, G

机构：

[1] Univ Padua, Dipartimento Chim Inorgan Met Organ & Analit, I-35131 Padua, Italy

[2] Univ Padua, Unit Ric, INFM, I-35131 Padua, Italy

[3] IV Kurchatov Atom Energy Inst, IGNP, RRC, Moscow 123182, Russia

来源：

THIN SOLID FILMS | 2001年 / 400卷 / 1-2期

关键词：

growth; photoelectron diffraction; epitaxy; vanadium oxide; platinum;

D O I：

10.1016/S0040-6090(01)01502-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

VOx ultrathin epitaxial films (0.8 less than or equal to x less than or equal to 1.3), grown on Pt( I I I) by evaporating vanadium in a controlled water background (1 X 10(-7) Pa), have been chemically characterised by X-ray photoelectron spectroscopy (XPS) and X-ray-excited Auger electron spectroscopy (AES), which confirm the presence of V(II). The VO film shows a NaCl-type structure exposing the (111) plane. as proven by XPD. Multiple scattering calculations are compatible with an O-terminated surface and a surface relaxation of the outermost atomic layers, which leads to a V-O bond length contraction amounting to 7%. (C) 2001 Elsevier Science BN. All rights reserved.

引用

页码：154 / 159

页数：6

共 21 条

[1] ELECTRICAL AND MAGNETIC PROPERTIES OF TIO AND VO [J].