Identifying molecular orientation of individual C60 on a Si(111)-(7 x 7) surface

被引：131

作者：

Hou, JG ^{[1
]}

Yang, JL

Wang, HQ

Li, QX

Zeng, CG

Lin, H

Bing, W

Chen, DM

Zhu, QS

机构：

[1] Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Peoples R China

[2] Univ Sci & Technol China, Open Lab Bond Select Chem, Hefei 230026, Peoples R China

来源：

PHYSICAL REVIEW LETTERS | 1999年 / 83卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.83.3001

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Low temperature scanning tunneling microscopy (STM) has been used to identify the molecular orientation of individual C-60 on Si(111)-(7 X 7) surfaces. The STM images of individual C-60 reveal clear and rich intramolecular features that are site and bias dependent. Theoretical simulations, using the local density approximation method with cluster models, uniquely reproduce the observed STM images and hence allow the unambiguous identification of the binding configurations of the adsorbed fullerenes with respect to the Si substrate.

引用

页码：3001 / 3004

页数：4

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