Fundamentals of MRAM technology

被引:51
作者
Slaughter, JM
Dave, RW
DeHerrera, M
Durlam, M
Engel, BN
Janesky, J
Rizzo, ND
Tehrani, S
机构
[1] Motorola Labs, Phys Sci Res Labs, Tempe, AZ 85284 USA
[2] Embedded Memory Ctr, Motorola Semicond Prod Sector, Tempe, AZ 85284 USA
来源
JOURNAL OF SUPERCONDUCTIVITY | 2002年 / 15卷 / 01期
关键词
magnetic random access memory; spin dependent tunnelling;
D O I
10.1023/A:1014018925270
中图分类号
O59 [应用物理学];
学科分类号
摘要
Developments in portable communication and computing systems are creating a growing demand for nonvolatile random access memory that is dense and fast. None of the existing solid-state memories can provide all the needed attributes in a single memory solution. Magnetoresistive Random Access Memory (MRAM) has the potential to replace these memories in various systems with a single, universal memory solution. Key attributes of MRAM technology are nonvolatility and unlimited read and write endurance. In addition, MRAM can operate at high-speed and is expected to have competitive densities. In this paper we describe several fundamental technical and scientific aspects of MRAM with emphasis on recent accomplishments that enabled our successful demonstration of a 256 kbit memory chip.
引用
收藏
页码:19 / 25
页数:7
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