Electric current effects on Sn/Ag interfacial reactions

被引:106
作者
Chen, CM [1 ]
Chen, SW [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu 30043, Taiwan
关键词
Sn/Ag; interfacial reaction; electromigration; apparent effective charge;
D O I
10.1007/s11664-999-0217-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of electric current on the Sn/Ag interfacial reaction was studied at 140 degrees C and 200 degrees C, by examining the growth of phase (e-Ag3Sn) in the Sn/Ag reaction couples with a constant current density. Only at 140 degrees C was the growth of phase affected by the passage of electric current. The growth rate was enhanced when diffusion of Sn and electron flow were in the same direction, and retarded when they were in the opposite direction. It was found that the diffusion coefficient of Sn through Ag3Sn was 3.37 mu m(2)/h and the apparent effective charge for Sn in Ag3Sn was -90, at 140 degrees C.
引用
收藏
页码:902 / 906
页数:5
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