A warm electron beam ion trap: The Micro-EBIT

被引：14

作者：

Khodja, H ^{[1
]}

Briand, JP ^{[1
]}

机构：

[1] UNIV PARIS 06,UA CNRS 771,INST RADIUM,LAB PHYS ATOM & NUCL,F-75252 PARIS 05,FRANCE

来源：

PHYSICA SCRIPTA | 1997年 / T71卷

关键词：

D O I：

10.1088/0031-8949/1997/T71/020

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The design of a very small, warm Electron Beam Ion Trap (named Micro-EBIT) is presented. This ion source uses a permanent magnetic field and an intense electron beam (1 A-10 kV), and has been found to produce very large amounts of highly charged ions.

引用

页码：113 / 116

页数：4

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