Application of a CdTe solid-state detector to polarization-dependent total-reflection fluorescence XAFS measurements

被引：8

作者：

Chun, WJ ^{[1
]}

Asakura, K ^{[1
]}

Iwasawa, Y ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,RES CTR SPECTROCHEM,TOKYO 113,JAPAN

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1996年 / 3卷

关键词：

polarization-dependent total-reflection fluorescence XAFS; CdTe detectors; molybdenum oxide; titanium oxide (110);

D O I：

10.1107/S0909049596005250

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A CdTe solid-state detector was applied to the measurement of polarization-dependent total-reflection fluorescence XAFS spectra. The data revealed that the detector has good sensitivity, and this, together with its compact size, make it appropriate for in-situ measurements and removal of X-ray Bragg diffraction. The detector efficiently recorded the high-energy K-edge XAFS spectra for molybdenum oxides supported on TiO2 (110).

引用

页码：160 / 162

页数：3

共 10 条

[1]

[Anonymous], 1978, SEMICONDUCTORS SEMIM

[2] STUDY OF THE XANES MODELING OF MOLYBDENUM COMPOUNDS [J].