Gamma spectrometric characterization of various CdTe and CdZnTe detectors

被引：24

作者：

Arlt, R

Gryshchuk, V

Sumah, P

机构：

[1] Int Atom Energy Agcy, A-1400 Vienna, Austria

[2] Univ Vienna, Atominst, A-1020 Vienna, Austria

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1999年 / 428卷 / 01期

关键词：

room-temperature semiconductor detectors; CdZnTe; CdTe; gamma spectrometry; nuclear safeguards;

D O I：

10.1016/S0168-9002(98)01589-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

CdZnTe and CdTe detectors are now used by the Department of Safeguards of the International Atomic Energy Agency in significant numbers. To prepare, plan and support various verification methods, their properties must be well characterized and understood. In this paper we present some of the results which were obtained with large volume hemispheric CdZnTe detectors and high-resolution CdTe detectors. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：127 / 137

页数：11

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