Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics

被引：294

作者：

Gruverman, A ^{[1
]}

Kalinin, SV

机构：

[1] N Carolina State Univ, Raleigh, NC 27695 USA

[2] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

JOURNAL OF MATERIALS SCIENCE | 2006年 / 41卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1007/s10853-005-5946-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nanoscale ferroelectric research, summarize the basic principles of PFM, illustrate what information can be obtained from PFM experiments and delineate the limitations of PFM signal interpretation relevant to quantitative imaging of a broad range of piezoelectrically active materials. Particular attention is given to orientational PFM imaging and data interpretation as well as to electromechanics and kinetics of nanoscale ferroelectric switching in PFM. (c) 2006 Springer Science + Business Media, Inc.

引用

页码：107 / 116

页数：10

共 49 条

[1] Higher order ferroic switching induced by scanning force microscopy [J].