Real-time atomic encoder using scanning tunnelling microscope and regular crystalline surface

被引:9
作者
Aketagawa, M
Takada, K
Rerkkumsup, P
Togawa, Y
Honda, H
机构
[1] Nagaoka Univ Technol, Dept Mech Engn, Nagaoka, Niigata 9402188, Japan
[2] Nagaoka Natl Coll Technol, Nagaoka, Niigata 9408532, Japan
[3] Pathumwan Inst Technol, Bangkok 10330, Thailand
关键词
displacement; length; nanometre; scanning tunnelling microscope (STM); lock-in modulation; atomic encoder; 2D encoder;
D O I
10.1088/0957-0233/17/3/S10
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we demonstrate a technique for highly stable atom-tracking control of a scanning tunnelling microscope (STM) tip by referring to an atomic point on a regular crystalline Surface. We also demonstrate an atomic encoder using 'atom-by-atom' step control along a crystalline axis. A graphite crystal, whose lattice spacing is approximately 0.25 rim, was utilized as the reference material. To enhance the stability of the atom-tracking control in the presence of external disturbances, a robust controller, consisting of an integrator, a tracer and limiter units, was developed. Experimental results show that the proposed method has high capability for maintaining the atom-tracking control without any jumping of the STM tip to adjoining atoms, even in a noisy environment. This method was also applied to atom-step control of the STM tip by referring to a specific crystalline axis. Atom-stepping control along a crystalline axis over a range of 200 atoms and at a rate of 10 atoms s(-1) was performed and demonstrated without missing the atomic array.
引用
收藏
页码:513 / 518
页数:6
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