Specification for a standard procedure of X-ray diffraction measurements on carbon materials

被引:440
作者
Iwashita, N
Park, CR
Fujimoto, H
Shiraishi, M
Inagaki, M
机构
[1] Natl Inst Adv Ind Sci & Technol AIST, Tsukuba, Ibaraki 3058569, Japan
[2] Seoul Natl Univ, Hyperstruct Organ Mat Res Ctr, Seoul 151744, South Korea
[3] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151744, South Korea
[4] Osaka Gas Co Ltd, Adv Mat Business Promot Dept, Konohana Ku, Osaka 5540051, Japan
[5] Tokai Univ, Sch High Technol Human Welfare, Numazu 4100395, Japan
[6] Aichi Inst Technol, Toyota 4700392, Japan
关键词
graphitization; X-ray diffraction; crystal structure;
D O I
10.1016/j.carbon.2004.02.008
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In 1963, the 117 Committee of the Japan Society for the Promotion of Sciences (JSPS) specified standard procedures for the determination of lattice constants and crystallite sizes of carbon materials, especially graphitized materials, the so-called "Gakushin" method. In 2002 the 117 Committee started to discuss the revision of the specification in order to accept some modern computing processes, such as automatic step-scanning measurements of diffraction intensities, profile fitting for diffraction lines, etc. In this paper, the English version of the revised specification is presented to the international community of scientists working on carbon materials, and to solicit comments. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:701 / 714
页数:14
相关论文
共 10 条
[1]  
ALEXANDER LE, 1954, J APPL PHYS, V25, DOI UNSP 155161
[2]  
Cullity BD, 1978, ELEMENTS XRAY DIFFRA
[3]  
FUJIMOTO H, 2003, TANSO, V206, P2
[5]  
*JSPS, 1963, TANSO, V36, P25
[6]   TRANSPARENCY FACTOR FOR WEAKLY ABSORBING SAMPLES IN X-RAY DIFFRACTOMETRY [J].
MILBERG, ME .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (01) :64-65
[7]   A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES [J].
RACHINGER, WA .
JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07) :254-255
[8]   SMOOTHING + DIFFERENTIATION OF DATA BY SIMPLIFIED LEAST SQUARES PROCEDURES [J].
SAVITZKY, A ;
GOLAY, MJE .
ANALYTICAL CHEMISTRY, 1964, 36 (08) :1627-&
[9]  
Shiraishi M, 2003, CARBON ALLOYS, P161, DOI 10.1016/B978-008044163-4/50010-3
[10]  
Warren E., 1969, XRAY DIFFRACTION